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SPIE Optical Metrology 2017 in München

Auf der Konferenz SPIE Optical Metrology 2017 in München halten am 27. Juni  M. Sc. Waldemar Gorschenew zum Thema "Flexible registration method for light stripe sensors considering sensor misalignments," Dipl.-Ing Lorenz Quentin zum Thema "3D geometry measurement of hot cylindric specimen using structured light" und M. Sc. Nina Loftfield zum Thema "3D registration of depth data of porous surface coatings based on 3D phase correlation and the Trimmed ICP algorithm" und am 29. Juli  M. Sc. Bettina Altmann zum Thema "Digital image processing algorithms for automated inspection of dynamic effects in roller bearings" Vorträge. 

Dipl.-Ing. Rüdiger Beermann stellt ein Poster zu dem Thema "Light section measurement to quantify the laser light deflection in an inhomogeneous refractive index field" vor.